Digital X-Ray

The AD7960 is an 18-bit, 5 MSPS charge redistribution successive approximation (SAR), analog-to-digital converter (ADC). The SAR architecture allows unmatched performance both in noise and in linearity. The AD7960 contains a low power, high speed, 18-bit sampling ADC, an internal conversion clock and an internal reference buffer. On the CNV± edge, the AD7960 samples the voltage difference between the IN+ and IN− pins. The voltages on these pins swing in opposite phase between 0 V and 4.096 V/5 V. The reference voltage is applied to the part externally. All conversion results are available on a single LVDS self-clocked or echo-clocked serial interface.

The AD7960 is available in a 32-lead LFCSP (QFN) with operation specified from −40°C to +85°C.

APPLICATIONS

• Digital imaging systems 
   Digital X-rays 
   Computed tomography 
   IR cameras
•  MRI gradient control
• High speed data acquisition
• Spectroscopy
• Test equipment

The AD7626 is a 16-bit, 10 MSPS, charge redistribution successive approximation register (SAR) based architecture analog-to-digital converter (ADC). SAR architecture allows unmatched performance both in noise (91.5 dB SNR) and in linearity (±0.45 LSB INL). The AD7626 contains a high speed, 16-bit sampling ADC, an internal conversion clock, and an internal buffered reference. On the CNV edge, it samples the voltage difference between the IN+ and IN− pins. The voltages on these pins swing in opposite phase between 0 V and REF. The 4.096 V reference voltage, REF, can be generated internally or applied externally.

All converted results are available on a single low voltage differential signaling (LVDS) self clocked or echoed clock serial interface, reducing external hardware connections.

The AD7626 is housed in a 32-lead, 5 mm × 5 mm LFCSP with operation specified from −40°C to +85°C.

Applications

• Digital imaging systems
  – Digital X-ray
  – Digital MRI
  – CCD and IR cameras
• High speed data acquisition
• High dynamic range telecommunications receivers
• Spectrum analysis
• Test equipment

The AD8488 is a 128-channel analog front end designed for use in high performance digital X-ray systems. The analog channels consist of an integrator followed by a gain selectable single-ended to low impedance differential output. The analog channel converts the charge acquired by X-ray or photodiode detectors to a voltage. The channels are composed of CMOS transistors, using typical high input impedance CMOS gates. The integrators generate charge dependent voltages using a range of selectable capacitance values that accommodate a broad range of input charge values. The integrators are followed by single-ended input to differential output voltage amplifiers where offset and low frequency noise voltages are subtracted from the input voltages. A 128:1 channel differential MUX follows the buffers and drives the analog output buffer. Switch drivers and certain digital timing functions are included, and all are mounted on a 255-lead BGA substrate. Charge conversion for all 128 channels is simultaneous followed by a sequential voltage output read of the channels using a 7-bit address code. The sequence occurs twice, sampling all 128 channels. Logic control inputs, CS_A and CS_B select the lower and upper 64-blocks of channel addresses.

The AD8488 is packaged in a 17 mm × 17 mm 255-lead RoHS compliant ball grid array (BGA). The operating temperature range is 0°C to 85°C ambient. 

Applications

• High performance digital X-ray systems
• Medical X-ray
• Security (baggage scanner) systems

All converted channel results are output on a single LVDS self-clocked serial interface that significantly reduces external hardware. An SPI-compatible serial interface allows configuration of the AFE using SDI input. The SDO output allows the user to daisy chain several AFEs on a single 3-wire bus.

An integrated AFE timing sequencer controls the sampling activity of the analog front end (AFE). The sequencer is programmed via the SPI port and is timed by a single clock, ACLK.

• Digital X-ray panel
• Photodiode sensors array
• CT Scanner
• High channel count data acquisition systems
  (current or voltage input)
• TFT panel readout

The ADIS16201 is a complete, dual-axis acceleration and inclination angle measurement system available in a single compact package enabled by the Analog Devices iSensor^™ integration. By enhancing the Analog Devices iMEMS^® sensor technology with an embedded signal processing solution, the ADIS16201 provides factory calibrated and tunable digital sensor data in a convenient format that can be accessed using a serial peripheral interface (SPI). The SPI interface provides access to measurements for dual-axis linear acceleration, dual-axis linear inclination angle, temperature, power supply, and one auxiliary analog input. Easy access to calibrated digital sensor data provides developers with a system-ready device, reducing development time, cost, and program risk.

Unique characteristics of the end system are accommodated easily through several built-in features, such as a single command in-system offset calibration, along with convenient sample rate and bandwidth control.

The ADIS16201 offers the following embedded features, which eliminate the need for external circuitry and provide a simplified system interface:

• Configurable alarm function
• Auxiliary 12-bit ADC
• Auxiliary 12-bit DAC
• Configurable digital I/O port
• Digital self-test function

The ADIS16201 offers two power management features for managing system-level power dissipation: low power mode and a configurable shutdown feature.

The ADIS16201 is available in a 9.2 mm × 9.2 mm × 3.9 mm laminate-based land grid array (LGA) package with a temperature range of −40°C to +125°C.

Applications

• Platform control, stabilization, and leveling
• Tilt sensing, inclinometers
• Motion/position measurement
• Monitor/alarm devices (security, medical, safety)